发明名称 Lithographic apparatus and device manufacturing method
摘要 A lithographic apparatus having an optical column capable of creating a pattern on a target portion of a substrate is disclosed. The optical column may have a self-emissive contrast device configured to emit a beam, and a projection system configured to project the beam onto the target portion. The apparatus may also have an actuator to move the optical column or a part thereof with respect to the substrate. The apparatus may be constructed to reduce the optical effect of density variation in a medium around the moving part of the optical column on the beam.
申请公布号 US9372412(B2) 申请公布日期 2016.06.21
申请号 US201514839663 申请日期 2015.08.28
申请人 ASML NETHERLANDS B.V. 发明人 Van Zwet Erwin John;De Jager Pieter Willem Herman;Onvlee Johannes;Fritz Erik Christiaan
分类号 G03B27/32;G03B27/54;G03F7/20 主分类号 G03B27/32
代理机构 Pillsbury Winthrop Shaw Pittman LLP 代理人 Pillsbury Winthrop Shaw Pittman LLP
主权项 1. A lithographic apparatus comprising: a self-emissive contrast device configured to emit a beam; a projection system configured to project the beam along an optical path onto a target portion of a substrate, the projection system comprising an optical element; an actuator to move at least the optical element with respect to the substrate; a first surface facing and immediately adjacent a radiation receiving surface of the optical element and with respect to which the radiation receiving surface of the optical element is movable, the first surface not having optical power and at least partly overlying the radiation receiving surface; a second surface facing and immediately adjacent a radiation emitting surface of the optical element and with respect to which the radiation emitting surface of the optical element is movable; and a control system configured to cause the self-emissive contrast device to modulate emission of the beam during projection and to cause the actuator to move the optical element during projection in a direction transverse to the optical path of the beam with respect to the first and second surfaces.
地址 Veldhoven NL