发明名称 Patterning in the directed assembly of block copolymers using triblock or multiblock copolymers
摘要 Provided herein are block copolymer thin film structures and methods of fabrication. The methods involve directing the assembly of ABA triblock copolymers such that desired features are formed by domains of the assembled ABA triblock copolymer. In some embodiments, an ABA triblock copolymer is directed to assemble by a chemical pattern. Chemical patterns with periods much different than the natural period of the ABA triblock copolymer may be used to direct assembly of the ABA triblock copolymer.
申请公布号 US9372398(B2) 申请公布日期 2016.06.21
申请号 US201213543667 申请日期 2012.07.06
申请人 Wisconsin Alumni Research Foundation 发明人 Nealey Paul Franklin;Ji Shengxiang
分类号 B32B27/28;B32B33/00;B05D3/10;G03F7/00;B81C1/00 主分类号 B32B27/28
代理机构 Weaver Austin Villeneuve & Sampson LLP 代理人 Weaver Austin Villeneuve & Sampson LLP
主权项 1. A structure comprising a thin film overlying a pattern, wherein the thin film comprises microphase-separated domains of an ABA triblock copolymer and wherein the pattern is replicated throughout the thickness of the thin film, wherein the ABA triblock copolymer has a bulk period Lo and the pattern has a period Ls that is greater than or equal to about 1.2 Lo.
地址 Madison WI US