发明名称 FAULT DIAGNOSTIC METHOD AND DEVICE THEREFOR
摘要 <p>PURPOSE:To always correctly detect an abnormality without causing an errone ous diagnosis and to rapidly specify the abnormal portion when the abnormality is detected. CONSTITUTION:Reference data for abnormality decision including the state of an output signal, the sequence of the transition and the time permitted for the transition and reference data for abnormality portion detection expressing the state of an input signal to be expected corresponding to each state of the output signal in this reference data are preliminarily prepared. The actual state of the output signal of a control device, the sequence of the transition and the transition time is compared with the reference data for abnormality decision and an abnormality in the output signal is detected (102 to 106). When the abnormality is detected, the portion where the abnormality occurred is specified in relation to the input signal by comparing the actual state of the input signal of the control device and the state of the expected input signal in the reference data for abnormality portion detection next.</p>
申请公布号 JPH05134740(A) 申请公布日期 1993.06.01
申请号 JP19910319753 申请日期 1991.11.08
申请人 OMRON CORP 发明人 NISHIDAI HAJIME;ISHIGURO SUSUMU;ARAO MAKI;IRIE ATSUSHI
分类号 G05B23/02;G05B19/05 主分类号 G05B23/02
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