发明名称 VACUUM-TIGHT PROBE FOR A THERMAL ELEMENT
摘要 <p>The probe is intended for use in oxidizing environments at temperatures in excess of 1800 °C. It contains wires (1, 2) which are introduced into a protective tube (5) and connected to each other at a junction point (3). The protective tube (5) is made either of a thermally-transparent ceramic material in the form of a monocrystal, or of a thermally-transparent oxide crystal such as Al2O3 (saphire) or ZrO2. Such materials have a good degree of permeability to infra-red radiation as well as being very sturdy and corrosion-resistant. A mounting (4) which supports the probe wires (1, 2) is for practical reasons made of the same material. The cavity inside the protective tube (5) can be either evacuated or filled with an inert gas. The probe has excellent long-term thermal endurance and responds extremely quickly to changes in temperature. It can be used to measure temperatures of up to c. 2200 °C.</p>
申请公布号 WO1993010427(A1) 申请公布日期 1993.05.27
申请号 DE1992000942 申请日期 1992.11.12
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