| 摘要 |
This invention provides a compound type microscope which can observe the measurement sample(57) of an atomic force microscope (AFM) by means of an optical microscope. This compound type microscope is comprised of an optical microscope having an objective (61) and an observation optical system (62), a cantilever (53) having a reflecting surface and detecting an atomic force, an irradiating optical system (51,52,60) for applying a spotlight to the cantilver, detecting means (54) for detecting the displacement of reflected light caused by the displacement of the cantilever, and a sample stage (55) for placing a sample thereon. Also, a scanning tunnel type microscope (STM) having an interchangeable probe and an optical microscope having an objective may be disposed coaxially with each other so that the sample can be measured by the STM instead of by the AFM, and provision may further be made of an AFM having a cantilever, and said probe and the cantilever may be selectively disposed below the objective. |
