发明名称 PROM WRITING CIRCUIT
摘要 <p>PURPOSE:To prevent deterioration of PROM writing characteristic due to the expansion of a PROM cell capacity and to facilitate the selection of the checkered pattern of the PROM cell at the time of a PROM writing test. CONSTITUTION:Each PROM cell 6 is provided with two each digit lines 7, and adjacent PROM cells 6 are connected alternately to the above two digit lines 7 to constitute a PROM cell array. By constituting the PROM cell array, the capacitance of the digit lines 7 is divided in two, and therefore the improvement of PROM writing characteristic is attained. Also, at the time of the PROM writing test, the selection of the checkered pattern of the PROM cell 6 is easily attained by switching the two digit lines 7.</p>
申请公布号 JPH05128879(A) 申请公布日期 1993.05.25
申请号 JP19910285803 申请日期 1991.10.31
申请人 NEC IC MICROCOMPUT SYST LTD 发明人 WATANABE TATSUHIKO
分类号 G11C17/00;G11C16/02;G11C16/06;G11C29/00;G11C29/10;G11C29/34 主分类号 G11C17/00
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