发明名称 Method and apparatus for dicing semiconductor substrates using an excimer laser beam
摘要 Method and apparatus for using deep ultraviolet excimer laser beams to dice semiconductor substrates, such as sapphire, with or without integrated circuitry, by establishing guided relative motion between the beam and the substrate to achieve ablative photodecomposition with the angle between the beam and the substrate being approximately five (5) degrees out of normal.
申请公布号 US5214261(A) 申请公布日期 1993.05.25
申请号 US19910790914 申请日期 1991.11.13
申请人 ROCKWELL INTERNATIONAL CORPORATION 发明人 ZAPPELLA, PIERINO I.
分类号 B28D1/22;H01L21/268;H01L21/301;H01L21/461;H01L21/78 主分类号 B28D1/22
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