| 摘要 |
PURPOSE:To obtain the speedy and inexpensive test method of CMOS circuit by giving a function for conducting a power current leak test after a pin contact test and for resetting a chip on the pattern of a function test and measuring steady source current after the function test terminates. CONSTITUTION:A test item consists of plural test items and it contains at least the pin contact test 1, a source current leak test 2 and the function-steady current test 3. The source current leak test 2 is conducted after the pin contact test 1 is conducted. Then, several test items 4 are executed and the function- steady source current test 3 is conducted. Then, several test items 5 are conducted and the test terminates. For controlling test time, the test is terminated when a fail is detected in the respective test items, and the measured CMOS integrated circuit is selected as defective goods 6. The CMOS integrated circuit passing all the test items is selected as acceptable goods 7. |
