发明名称 MANUFACTURING METHOD OF APPEARANCE LIMIT SAMPLE TOOL, AND APPEARANCE LIMIT SAMPLE TOOL
摘要 PROBLEM TO BE SOLVED: To provide a manufacturing method of an appearance limit sample tool that can easily and inexpensively manufacture an appearance limit sample tool and can easily form various appearance limit samples.SOLUTION: The manufacturing method of an appearance limit sample tool 10 having a defect sample includes a defect sample formation process of pressing an instrument onto a surface of a transparent optical member 11, concentrating a plurality of impressions, and forming a first defect sample 13. Preferably, after the defect sample formation process, the method includes a coating process of coating the surface of a transparent optical member 11 with a coating layer 12.SELECTED DRAWING: Figure 1
申请公布号 JP2016161398(A) 申请公布日期 2016.09.05
申请号 JP20150040272 申请日期 2015.03.02
申请人 MURAKAMI CORP 发明人 YASUMOTO YOSHI
分类号 G01N21/93;C03B23/02;C03C17/245;G01N21/84;G02B3/00;G09F5/04 主分类号 G01N21/93
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