发明名称 |
FABRICATION OF SEMICONDUCTOR DEVICES USING PHOSPHOSILICATE GLASSES |
摘要 |
Fabrication of Semiconductor Devices Using Phosphosilicate Glasses This invention is directed to a process of producing semiconductor i devices which involves deposition of protective glass layers by a particle beam technique from targets of phosphosilicate glass, as well as a process for production of such targets. The phosphosilicate glass containing 1-15 mole percent P2O5 is produced by a sol/gel technique which involves mixing of a fumed silica, with a surface area of 50-400 m2/g, preferably about 200 m2/g, with phosphoric acid andwater to form a sol with 20-55 wt. % silica, allowing it to gel, drying at ambient conditions, dehydrating at about 650.degree.C in an atmosphere of an inert gas and chlorine and fluorine containing gases, heating up at a certain rate of from 100 to 180.degree.C per hour to a peak sintering temperature below 1200.degree.C and cooling so as to produce amorphous and transparent glass suitable for use as a target. The glass layers are highly advantageous as encapsulating layers, diffusion barrier layers, etc., especially for optical type and semiconductor devices. Production of the phosphosilicate glass by the sol/gel technique is highly advantageous over the conventional melting technique, being faster and much less expensive than the latter.
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申请公布号 |
CA2014934(C) |
申请公布日期 |
1993.05.25 |
申请号 |
CA19902014934 |
申请日期 |
1990.04.19 |
申请人 |
AMERICAN TELEPHONE AND TELEGRAPH COMPANY |
发明人 |
FLEMING, DEBRA A.;JOHNSON, DAVID W., JR.;SINGH, SHOBHA;VANUITERT, LEGRAND G.;ZYDZIK, GEORGE J. |
分类号 |
C03C3/062;C03C3/097;H01L21/314;H01L21/316;(IPC1-7):H01L21/203;C03B20/00;C30B23/00;C23C14/10;H01L21/56 |
主分类号 |
C03C3/062 |
代理机构 |
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