发明名称 MANUFACTURE OF SEMICONDUCTOR STORAGE DEVICE
摘要 PURPOSE:To obtain a method for extending an electrode surface at a low temperature and with a simple process, by forming fine unevenness on the electrode surface. CONSTITUTION:On a BPSG film 6 turning to a first insulating film, an SiO2 film 8 turning to a second insulating film having a rough surface is formed by thermal decomposition reaction of organic source and oxygen which contains ozone of 4wt.% or more. Then a first semiconductor film 11 turning to a storage electrode is formed. Thereby the surface area of an electrode is extended, and sufficient capacitance for a small cell area can be obtained at a low temperature and with a simple process.
申请公布号 JPH05121692(A) 申请公布日期 1993.05.18
申请号 JP19910277418 申请日期 1991.10.24
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 MATSUDA TAKAYUKI
分类号 H01L21/28;H01L21/822;H01L21/8242;H01L27/04;H01L27/10;H01L27/108 主分类号 H01L21/28
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