发明名称 |
Semiconductor device manufacturing method and semiconductor device manufactured thereby |
摘要 |
A method for manufacturing a semiconductor device comprises the steps of forming a polysilicon spacer on an after-oxide film on a semiconductor substrate, doping the polysilicon spacer by ion-implanting an impurity such as phosphorus, thermally diffusing the impurity into the polysilicon spacer, and eliminating the polysilicon spacer in part by etching. A semiconductor device manufactured by this method is also disclosed.
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申请公布号 |
US5212105(A) |
申请公布日期 |
1993.05.18 |
申请号 |
US19910804506 |
申请日期 |
1991.12.10 |
申请人 |
KABUSHIKI KAISHA TOSHIBA |
发明人 |
KIZU, TATSUKI;SHIMADA, SHINICHI;KOBAYASHI, KIYOSHI |
分类号 |
H01L21/033;H01L21/336;H01L29/78 |
主分类号 |
H01L21/033 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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