发明名称 SENSE CIRCUIT FOR THERMALLY SHIELDING INTEGRATED CIRCUIT DEVICE ON CHIP AND METHOD OF SENSING THERMAL TROUBLE
摘要 PURPOSE: To inform a host system of the presence of barrier conditions by detecting an average junction temperature of an IC device and generating electric signals, when exceeding a predetermined value. CONSTITUTION: A fundamental structure of a sense circuit is a comparator comprising transistors Q3 , Q4 , which are strong in a local junction temperature, and of which an input is a predictable voltage. The junction temperature is detected by first and second junction diode strings D3 to D6 , D7 to D10 connected so as to generate a complementary increase and decrease of an input voltage of this comparator. A voltage, corresponding to a predetermined threshold temperature, is preset by selecting a suitable resistance value, and a state of the comparator is changed by this voltage. When a state change of this comparator is detected, namely when an average junction temperature exceeds a predetermined value, electric signals are generated. Thereby, a fatal damages to the device are avoided, and the presence of barrier conditions can be informed to a host system.
申请公布号 JPH05121667(A) 申请公布日期 1993.05.18
申请号 JP19920091046 申请日期 1992.04.10
申请人 INTERNATL BUSINESS MACH CORP <IBM> 发明人 DENISU EMU FURIN;PIITAA EMU IPORITO
分类号 G01K7/00;G01K7/01;G01R31/28;H01L21/822;H01L27/04;H02H5/04 主分类号 G01K7/00
代理机构 代理人
主权项
地址