| 摘要 |
PURPOSE:To improve the quality of a data processing apparatus by attaching malfunction detecting and displaying functions to integrated circuit elements themselves, and readily detecting the malfunction of the integrated circuit element. CONSTITUTION:EXOR circuits 3, 11, 19 and 27, a NOR circuit 33 and a light emitting diode 35 are assembled in addition to AND circuits 2, 10, 18 and 26 as malfunction detecting and displaying means for detecting and displaying the malfunction of an integrated circuit element for the integrated circuit elements (AND circuits 1, 9, 17 and 25) used in the logic circuit of a data processing apparatus. When the malfunction has occurred in the integrated circuit elements (AND circuits 1, 9, 17 and 25), the malfunction is detected and displayed with the light emitting diode 35. |
