| 摘要 |
PURPOSE:To improve the hit rate of a suspected device, which is outputted from a faulty device analysis dictionary, by adding an indicating history to the faulty device analysis dictionary and updating the faulty device analysis dictionary whenever a fault occurs. CONSTITUTION:A fault analysis circuit 2 analyzes fault data extracted in a fault extraction circuit 1, and outputs a fault status based on the type of the fault. An internal memory 4 holds a faulty device analysis table, and is used for finding the fault-suspected device from the outputted fault status. The name of the fault-suspected device, which is obtained from the result of analysis, is displayed in a display device 5 and the device is exchanged based on the display so as to execute fault restoration. When the fault is not restored by the exchange of the indicated device, the name of the faulty device which becomes clear by later restoration work, and it is added on a faulty device analysis table. Thus, the suspected device can be hit when the same fault occurs next if the suspected device is not hit by the analysis of the fault. |
