| 摘要 |
<p>The stretched skin (12) is passed at a defined rate transversely through an illumination device (23) with a detector line for mutually offset linewise detection of longwave infrared. Outline images of the grain side and/or intensity of light transmitted from rear of the skin are obtained. The detected radiation intensity information is parallel processed in an evaluation device (30) in which expert information about types of defect can be converted into classification information according to the size, type, position and quantity of skin defects. USE/ADVANTAGE - Performs objective classification in real time during processing of animal skins into leather.</p> |
