| 摘要 |
<p>The present invention relates to apparatuses and methods for measuring and controlling the amount of multiple coating materials applied to a substrate (12), and in particular to an apparatus (10) and method for monitoring and regulating the amount of multiple coating materials (24 and 25) containing different compositions applied to a substrate (12), such as paperboard. The coating measurement is insensitive to changes in both the amount of substrate (12) as well as in the amount of an interfering component associated with the substrate (12).</p> |
