发明名称 |
MIKROKUEVETTE FUER DIE INFRAROTSPEKTROSKOPIE |
摘要 |
The cuvette has inlet and outlet windows (1, 2), at least one sample volume (4) and a spacer 3, and is characterised in that the inlet and the outlet window are designed as wafers (1, 2) of high-resistance silicon, in that the spacer (3) is a layer of silicon dioxide applied to the first wafer (1) and which has a recess (4) surrounded by the layer serving as the sample volume, and in that the second silicon wafer (2) has two openings (5, 6) which emerge in the recess of the silicon dioxide layer, and in that the second silicon wafer (2) is firmly bonded to the silicon dioxide layer. Openings (5, 6) serve as inlet and outlet for samples undergoing investigation. Wafers (1, 2) may have anti reflex layers (7). <IMAGE> |
申请公布号 |
DE4137060(A1) |
申请公布日期 |
1993.05.13 |
申请号 |
DE19914137060 |
申请日期 |
1991.11.11 |
申请人 |
FRAUNHOFER-GESELLSCHAFT ZUR FOERDERUNG DER ANGEWANDTEN FORSCHUNG EV, 8000 MUENCHEN, DE |
发明人 |
KLUMPP, ARMIN, DIPL.-PHYS., 8000 MUENCHEN, DE;HACKER, ERWIN, DIPL.-ING., 8950 KAUFBEUREN, DE |
分类号 |
G01N21/03;G01N21/35;G01N21/3577 |
主分类号 |
G01N21/03 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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