发明名称
摘要 PURPOSE:To attain to enhance the trouble detection rate of LSI, by providing a lead wire connected to the predetermined position in an integrated circuit, a gate element for constituting the lead wire and an exclusive terminal. CONSTITUTION:A bus gate is arranged directly before a test exclusive pad (b) while the terminals BUS1, BUS3, BUSCONT1, 2 of the bus gate corresponds to the exclusive pad (b), the terminals RESET1, CLOCK1, DATA1, CLOCK2, DATA 2, CLOCK3, OUT1 to a normal pad (c) and the remainders to an internal gate region (a). When BUS1, 2 are brought to an output state and only BUS3 to an input state, the trouble detection of PART1, 3 is enabled and, when BUS1, 2 are brought to an input state and only BUS3 to an output state, CHECK of PART2 is enabled.
申请公布号 JPH0530227(B2) 申请公布日期 1993.05.07
申请号 JP19820226616 申请日期 1982.12.27
申请人 FUJITSU LTD 发明人 SUDO TAKEYUKI
分类号 G01R31/28;G01R31/316 主分类号 G01R31/28
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