发明名称 SHORT-CIRCUIT TESTING DEVICE FOR BREAKER
摘要 <p>PURPOSE:To obtain the titled device capable of carrying out the cutoff test of an asymmetrical alternating current. CONSTITUTION:The first and second current source capacitors Ci1 and Ci2, and the first and second current source reactors Li1 and Li2 are provided in a current source circuit 1. The first resonance circuit is constituted of the capacitor Ci1 and the reactor Li1, and the second resonance circuit by the capacitor Ci2 and the reactor Li2. The resonant frequency of the first circuit is set about two times of one of the second circuit, their frequencies are used as test frequencies, and the oscillating currents of the first and second circuits are superposed and supplied to a breaker Sp to be tested.</p>
申请公布号 JPH05113470(A) 申请公布日期 1993.05.07
申请号 JP19910272825 申请日期 1991.10.21
申请人 NISSIN ELECTRIC CO LTD 发明人 ASAKURA TAKAO
分类号 G01R31/327;G01R31/333 主分类号 G01R31/327
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