| 摘要 |
According to a method for manufacturing a nonvolatile semiconductor memory device, first, a CVD oxidation film is formed in a side wall portion of a floating gate formed on a semiconductor substrate. Then, a thermal oxidation film is formed between said floating gate and said CVD oxidation film by a thermal oxidation method. Additionally, before forming said CVD oxidation film, a thermal oxidation film may be formed in the side portion of said floating gate.
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