发明名称 Semiconductor device and manufacturing method therefor
摘要 A semiconductor device comprises a semiconductor substrate, a semiconductor layer of a first conductivity type formed on said semiconductor substrate, a first semiconductor well region of a second conductivity type and second semiconductor well regions of the second conductivity type, the latter two types of regions being formed in said semiconductor layer. The first semiconductor well region is located at the peripheral area of the semiconductor, and the well is deeper than the well of the second semiconductor well regions. Third semiconductor well regions of the first conductivity type are formed in the second semiconductor well regions. Gate electrodes and an emitter (source) electrode are formed at specified positions on the upper surface of the semiconductor device, and a collector (drain) electrode is formed on the bottom surface.
申请公布号 US5208471(A) 申请公布日期 1993.05.04
申请号 US19910762793 申请日期 1991.09.19
申请人 HITACHI, LTD. 发明人 MORI, MUTSUHIRO;YASUDA, YASUMICHI;NAKANO, YASUNORI
分类号 H01L21/331;H01L21/336;H01L29/06;H01L29/10;H01L29/739;H01L29/78 主分类号 H01L21/331
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