| 摘要 |
PURPOSE:To cancel the variation of a quality judgment by correcting a luminance characteristic so that the luminance characteristic of an appearance checking device can be matched with the luminance characteristic of a master device. CONSTITUTION:A camera 2 and an annular light source 3 are mounted on an XY table 1. An electronic part 5 is fixed to a substrate 4 by a solder 6. Then, the checking area E of the camera 2 is set so as to surround the solder 6 being the subject to be tested. A table 8 is provided at the side part of the substrate 4, and a checking model M is mounted on it. The checking model M has a white part WH and a black part BL as a part whose lightness or light reflection factor is different. When the area thA of an A device is more than a set area TH, the shape of the solder is judged to be nondefective and when the area thB of a B device is less than the set area TH, the shape of the solder is judged to be defective. When the judgment of the A device is correct for the actual nondefective solder 6, the A device is selected as the master device, and the correction value of the set luminance by which the area thB of the device B can be equal to the area thA of the A device is searched. |
