| 摘要 |
<p>A device for non-destructively and continuously measuring and/or monitoring the thickness of a shaped section, comprising a) at least one means (2) for altering the temperature of said section, b) at least one means (3) for detecting and measuring the radiation emitted by said section during thermal transition, and c) at least one means (4) allowing said radiation detecting and measuring means to scan the whole section surface. Said detecting and measuring means is connected to a computer system (5) which includes image processing software, a radiation recording means and a display screen (6).</p> |
