| 摘要 |
A tandem mass spectrometry system, capable of obtaining tandem mass spectra for each parent ion without separation of parent ions of differing mass from each other, comprising an ion source, (1) a particle detector (6), two separated time-of-flight devices (3, 5) between the source and the detector, a control ion-excitation device (4) between the time-of-flight devices, and means measuring a time-of-flight for particles reaching the detector (6), all of which lie on a common ion path, and wherein ion optics maintain ion flight from the source within the ion path and a computer control system controls the excitation device (4) and the optics.
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