TEST OF INTEGRATED CIRCUIT DEVICE AND METHOD THEREOF

摘要

PURPOSE: To accurately evaluate the connection between a printed circuit board and a very large scale integrated circuit(VLSI) by providing a two-way driver/ receiver which can be controlled by impressing test signals upon the board and device. CONSTITUTION: The internal circuit test of a VLSI chip for input-output is conducted by using I/O mapping. An internal circuit testing device on the outside of a circuit board and device causes a driver to generate a high impedance by impressing a control signal which sets the driver to a try state upon a pin 60 and effectively disconnects the pin 60 from a functional route in the device. When the pin 60 is disconnected, the control signal impressed upon the pin 60 as an input is passed through a mapping testing route provided in a multiplexer connected to a noncritical output pin 61 and a test signal is again sent to the output pin 61 after the contact between both the pins mounted on the circuit board is confirmed under the control of an ICT.