| 摘要 |
PURPOSE:To assign the constraint condition of a functional macro, and obtain input value from the constraint condition by means of an IF-THEN operation so as to generate a test pattern which meets the constraint condition, in the test pattern generation of a logical circuit, using the functional macro having the constraint condition. CONSTITUTION:An assigned 'functional macro B' 10 is searched by a macro search unit 1, and an value is determined at an external terminal by means of an IF-THEN operation so as to meet a constraint condition 'the value of first input pin is set to 1' by a value determination unit 2. The first input of the functional macro B 10 is determined so that the output of an AND A 9 is set to '1'. That is, both external terminals T3, T4 are determined to be '1'. A test pattern is generated for the external terminals T1, T2, T5-T8, where no value has been determined by using a well-known test generation algorithm (FAN algorithm) of a pattern which detects undetected failures in a circuit. |
