发明名称 MEASURING METHOD FOR CHARGED POTENTIAL AND CALCULATING METHOD FOR ELIMINATED POTENTIAL
摘要 PURPOSE:To decrease the calculation time in a mutitude of calculations in various conditions by calculating the surface electron charge accumulated on a induction body from the potential difference between the induction body surface and corona discharge wire. CONSTITUTION:By assuming the potential on a light sensor 7 at a certain value, an ion current density (DELTAV-J) table is made. Then, by setting the initial surface charge on the light sensor 7 and considering the charge, the electric potential on the light sensor 7 is calculated from the potential distribution in the space including a charger and eliminator and in the region of the light sensor 7. Ion current density to each point on the light sensor is obtained by referring to the DELTAV-J table from the potential difference DELTAV between this potential and discharge wire 3 and surface charge on the light sensor 7 is calculated. And by solving a charge move equation corresponding to the moving velocity of the light sensor 7, the surface charge distribution on the light sensor 7 is calculated to obtain the potential on the light sensor 7. Thus, the calculation is continued till the required time and charge potential on the light sensor 7 is obtained.
申请公布号 JPH0599966(A) 申请公布日期 1993.04.23
申请号 JP19910257333 申请日期 1991.10.04
申请人 RICOH CO LTD 发明人 WATANABE YOSHIO;OKADA KENJI;SATO MASUMI
分类号 G01R29/12;G01R29/24;G03G5/00;G03G15/00;G03G15/02;G03G21/00;G03G21/06 主分类号 G01R29/12
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