发明名称 AUTOMATIC DETECTION CIRCUIT OF STATE VARIATION
摘要 The circuit detects external or internal state change of a microprocessor controlled control system at the point that state change occurs so that real time processing is accomplished. The circuit comprises a first buffer (10) for protecting system from external state signals, a second buffer (20) for buffering external state signal and internal state signal of a control system, a comparator unit (30) for comparing external and internal state signals with their former states, a logic unit (40) for generating read signal to the second buffer (20) and the comparator unit (30) when state changes are detected by the comparator unit (30), and a microprocessor (50) for transmitting logic control signal to the logic unit to read changed state when state change signal is received and for controlling a system according to new states.
申请公布号 KR930003165(B1) 申请公布日期 1993.04.23
申请号 KR19900002134 申请日期 1990.02.21
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 HONG, KYE - SONG
分类号 G06F1/00;(IPC1-7):G06F1/00 主分类号 G06F1/00
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