发明名称 TESTABLE RAM ARCHITECTURE IN A MICROPROCESSOR HAVING EMBEDDED CACHE MEMORY
摘要 A microprocessor (100) with embedded cache memory (204) is disclosed. In a "test mode" of operation, caches (204) are accessed directly from the memory interface signals. Direct writing and reading to/from the instruction and data caches (204) allows the testing of the functionality of the cache memory arrays (204). External memory interface is granted to an external master via a bus arbitration mechanism so that the test mode operation can be utilized. <IMAGE>
申请公布号 EP0480421(A3) 申请公布日期 1993.04.21
申请号 EP19910117293 申请日期 1991.10.10
申请人 LSI LOGIC CORPORATION 发明人 FUCCIO, MICHAEL;DESAI, SANJAY
分类号 G01R31/319;G06F11/267;G06F11/273;G06F12/08;G11C29/24;G11C29/36;G11C29/48;(IPC1-7):G11C29/00 主分类号 G01R31/319
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