发明名称 |
TESTABLE RAM ARCHITECTURE IN A MICROPROCESSOR HAVING EMBEDDED CACHE MEMORY |
摘要 |
A microprocessor (100) with embedded cache memory (204) is disclosed. In a "test mode" of operation, caches (204) are accessed directly from the memory interface signals. Direct writing and reading to/from the instruction and data caches (204) allows the testing of the functionality of the cache memory arrays (204). External memory interface is granted to an external master via a bus arbitration mechanism so that the test mode operation can be utilized. <IMAGE> |
申请公布号 |
EP0480421(A3) |
申请公布日期 |
1993.04.21 |
申请号 |
EP19910117293 |
申请日期 |
1991.10.10 |
申请人 |
LSI LOGIC CORPORATION |
发明人 |
FUCCIO, MICHAEL;DESAI, SANJAY |
分类号 |
G01R31/319;G06F11/267;G06F11/273;G06F12/08;G11C29/24;G11C29/36;G11C29/48;(IPC1-7):G11C29/00 |
主分类号 |
G01R31/319 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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