发明名称 STRUCTURE FOR SUPPRESSION OF FIELD INVERSION CAUSED BY CHARGE BUILD-UP IN THE DIELECTRIC
摘要 <p>The invention relates to an integrated circuit including one or more amorphous silicon layers (14, 14a, 15, 15a) for neutralizing charges which occur in various dielectric layers (6) during fabrication. The amorphous silicon layers include dangling silicon bonds which neutralize charges which would otherwise cause isolation breakdown, impair integrated circuit performance and increase manufacturing costs.</p>
申请公布号 WO9307644(A1) 申请公布日期 1993.04.15
申请号 WO1992US08657 申请日期 1992.10.09
申请人 VLSI TECHNOLOGY, INC. 发明人 NARIANI, SUBHASH, R.;JAIN, VIVEK;PRAMANIK, DIPANKER;CHANG, KUANG-YEH
分类号 H01L21/76;H01L21/314;H01L21/316;H01L23/29;H01L23/532;H01L27/115 主分类号 H01L21/76
代理机构 代理人
主权项
地址