| 摘要 |
A programmable interface apparatus (12a-12f) between a first operational circuit and either a second operational circuit (16), or a primary pin (14a-14f), of an IC includes a latch for receiving a test signal. The latch is controlled using probe lines (32) and sense lines (34) from an internal test matrix (18). In one configuration, such an interface is programmably configured to couple either a primary input signal or a test signal to the operational circuitry. In another configuration, such an interface (12a-12f) is programmably configured to couple either an operational circuit signal or a test signal to a primary output pin (14a, 14b, 14c). In another configuration, such an interface in programmably configured to couple either an operational circuit signal or a test signal to an operational circuit element. In one embodiment, the interface (12a-12f) is formed with a pair of transmission gates, the latch (168) and an inverter (44). A global control signal (c) is coupled to each transmission gate (62, 64) for configuring the interface for normal operation or test signal operation. |
