发明名称 FORMATION OF SEMICONDUCTOR FINE WIRING
摘要 PURPOSE:To realize a semiconductor fine wiring, which can be mass-produced, by forming a grating without dividing a crystal because of using oblique etching through dry etching unlike a cleavage method used heretofore so as to enable photolithography to be conducted thereafter. CONSTITUTION:After the growth of a crystal of AlGAs/GaAs multilayered structure 2, dry etching is used to obliquely etch the crystal. Grating 9 is formed when selective etching is conducted on a slope 8 formed at that time, The period of this grating 9 can be accurately controlled by the film thickness of the AlGaAs/GaAs multilayered structure 2 and the angle of inclination of dry etching.
申请公布号 JPH0590612(A) 申请公布日期 1993.04.09
申请号 JP19910278496 申请日期 1991.09.30
申请人 NEC CORP 发明人 SUGIMOTO MITSUNORI
分类号 H01L21/20;H01L21/302;H01L21/3065;H01L29/06;H01L29/80 主分类号 H01L21/20
代理机构 代理人
主权项
地址