发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURE THEREOF
摘要 PURPOSE:To ensure the contact area for the active region of a MOS transistor, in a semiconductor integrated circuit constituted of miniaturized MOS transistors. CONSTITUTION:After a gate oxide film 3 and a gate electrode 4 are formed on a P-type semiconductor substrate 1, a first insulating film 7, a second insulating film 8 and a third insulating film 9 are deposited. The third insulating film 9 is selectively eliminated by using a first resist pattern 10 as a mask. After the mask 10 is eliminated, the third insulating film 9, the second insulating film 8 and the first insulating film 7 which are left are etched back until the active region of a transistor is exposed, and a side wall protecting film different in thickness is formed on the side wall of the gate electrode.
申请公布号 JPH0590537(A) 申请公布日期 1993.04.09
申请号 JP19910248843 申请日期 1991.09.27
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 OGAWA HISASHI;IMAI SHINICHI
分类号 H01L21/28;H01L21/336;H01L21/8234;H01L21/8242;H01L27/088;H01L27/10;H01L27/108;H01L29/78 主分类号 H01L21/28
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