发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
摘要 The semiconductor device of the present invention includes a semiconductor substrate on which are formed semiconductor elements, and a plurality of wiring layers formed on the semiconductor substrate via porous insulating films. The surface of the plurality of the wiring layers is preferably covered with a compact insulating film. The size of the pores in the porous insulating film is preferably 5 nm to 50 nm in diameter, and the volume of the pores in the porous insulating film is preferably 50% to 80% of the total volume of the porous insulating film. The porous insulating film is formed by subjecting a mixed insulating film of a basic oxide and an acidic oxide to a heat treatment to precipitate only either one of the basic oxide and the acidic oxide, and then dissolving out selectively the basic or acidic oxide precipitated.
申请公布号 KR930002670(B1) 申请公布日期 1993.04.07
申请号 KR19890003038 申请日期 1989.03.13
申请人 NIPPON ELECTRIC CO., LTD. 发明人 SAKAMOTO, MITSURU;HAMANO, KUNIYUKI
分类号 H01L21/31;H01L21/312;H01L21/316;H01L21/768;H01L23/522;H01L23/532;H05K1/00;(IPC1-7):H01L21/28 主分类号 H01L21/31
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