| 摘要 |
PURPOSE:To easily perform the ATM test like the load test in a small device scale with respect to the ATM test system for the load test or the like of incoming-side/outgoing-side FIFO memories used in the ATM cross connect processing part of a communication equipment like an ATM multiplex transmission equipment. CONSTITUTION:Write means 121 to 12M are provided which forcibly write dummy load cells in incoming-side or outgoing-side FIFO memories 11 of the ATM cross connect processing part. At the time of the ATM test, dummy load cells are written in FIFO memories as the test object by write means to perform the load test of FIFO memories. |
