| 摘要 |
PURPOSE:To automatically perform an abnormal response in an input/output device based on the setting data from a channel, regarding a channel function test system for the abnormal response in the input/output device. CONSTITUTION:A pseudo input/output device 2 is connected with a channel 1. The channel 1 is provided with a setting data generation part 3 generating setting data 6 instructing an abnormal response to the pseudo input/output device 2 and the pseudo input/output device 2 is provided with an abnormal response signal generation part 4 returning the abnormal response to the channel based on the setting data 6 transmitted from the channel 1. In the setting command execution cycle, the channel 1 transmits the setting data 6 to the pseudo input/output device 2 and the pseudo input/output device 2 sets the setting data 6. In a subsequent command execution cycle to be tested, the channel 1 transmits a command to be tested to the pseudo input/output device 2 and the abnormal response signal generation part 4 of the pseudo input/output device 2 returns the abnormal response to the channel in accordance with the instruction of the setting data 6. |
