| 摘要 |
PURPOSE:To provide an image data defect detector which does not require a large quantity of judging data and avoids a false detection due to the deviation in location of image data. CONSTITUTION:A comparison circuit 4 compares the image data from a standard variable-density image data storage circuit and the image data from an input device 3 for each picture element, outputting differential image data to a labeling circuit 6 through a binary circuit 5. The labeling circuit 6 extracts picture elements most suitable for defects and outputs the data about the location of those picture elements as labeling image data to a distributed value selection circuit 10. Meanwhile, a distributed value of the image data inputted into a storage circuit 7 is calculated by a distributed value calculating circuit 8. Based on the labeling image data, the distributed value selection circuit 10 selects the distributed value for the picture element which has been decided most suitable for defects and a judging circuit 12 determines whether the selected distributed value is within the range of defects stored in a register 11. |
