| 摘要 |
Reflection polariscope for measuring photoelastic images, which contains a photoelastic layer fixed to the tested structure via a reflection layer, and the polariscope head composed of the polariscope and quarter-wave plate unit located on the path of the light beam coming from the light source and from the combined analyser and wave-quarter plate unit located on the path of the reflected light beam incident on the image recorder characterised in that the light source (1) and the image recorder (4) are connected to the head (3) via flexible fibre-optic cables (2A, 2B).<IMAGE>
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