发明名称 MODIFICATION OF INTERFACIAL FIELDS BETWEEN DIELECTRICS AND SEMI-CONDUCTORS
摘要 Reduction in the net charge at the interface of a dielectric and a semiconductor material is achieved by placing atomic species in the dielectric near the interface. Preferably, these species are selected from the group of alkaline earth metals. The presence of these atoms results in a redistribution of the electronic density near the interface. The placement of the atoms is effected by ion implantation followed by multiple annealing steps at alternating low and high temperatures.
申请公布号 CA1315420(C) 申请公布日期 1993.03.30
申请号 CA19880577875 申请日期 1988.09.20
申请人 NATIONAL SEMICONDUCTOR CORP. 发明人 ARONOWITZ, SHELDON
分类号 H01L29/06;H01L21/28;H01L21/3115;H01L21/316;H01L21/324;H01L29/51;H01L29/78 主分类号 H01L29/06
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