INTEGRATED CIRCUIT TEST FIXTURE AND METHOD,申请号US19900546523-传众专利搜索

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发明名称	INTEGRATED CIRCUIT TEST FIXTURE AND METHOD
摘要
申请公布号	US5198753(A)	申请公布日期	1993.03.30
申请号	US19900546523	申请日期	1990.06.29
申请人	DIGITAL EQUIPMENT CORPORATION	发明人	HAMBURGEN, WILLIAM R.
分类号	G01R31/26;G01R1/04;H01L21/66	主分类号	G01R31/26
代理机构		代理人
主权项
地址

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