| 摘要 |
PURPOSE:To obtain a bypass scan path enabling reduction in the number of control signals and an integrated circuit device using the same. CONSTITUTION:A bypass scan path is made up of a scan path 10 and a scan path selection circuit 20a. The operation of the scan path 10 is controlled by a group of control signals containing a strobe signal STB, an updating signal UD and shift clock signals SCLK1 and SCKL2. The operation of the scan pass selection circuit 20a is controlled by the group of control signals for a reset signal and a scan pass and hence, no other control signals are needed. The group of control signals for the reset signal and the scan pass 10 can be generated with a test controller prescribed to a scale of a boundary scan test of an IEEE 1149.1. |
