Self-contained functional test apparatus for modular circuit cards

摘要

A self-contained test apparatus is provided for performing functional tests on any one of a plurality of varied function, modular circuit cards. The apparatus includes a power source and a series of switches electrically connecting the power source to the inputs of a modular circuit card under test. Each of the switches is manually set to a predetermined position based upon the function of the modular circuit card. One of either a TTL logical high or low is applied to each of the inputs. The test apparatus includes means for simulating the normal operational load characteristics of the modular circuit card in order to effectively test the card's function. Means are further provided for comparing a TTL logic response generated at each of the outputs with an expected response. The comparison is indicative of a pass/fail condition at each output whereby the functional test is passed only if all outputs achieve a pass condition.