发明名称 OPTICAL SUBSTRATE CHECKING DEVICE
摘要 PURPOSE:To provide a substrate checking device which optically checks a substrate with only an objective hole filled up even in the case that through holes and via holes different having different diameters exist together. CONSTITUTION:This substrate checking device is provided with a reflected light camera 5 which picks up the image of illumination for reflected light and the image of the reflected light, a transmitted light camera 6 which picks up the image of transmitted light illumination illuminating the substrate to be checked from the rear face and the image of the transmitted light, a picture extracting means 52 which extracts the picture of a specific pattern by degeneracy and expansion of the output of the transmitted light camera 6, a picture synthesizing means 53 which synthesizes the picked-up image of the reflected light camera and the output picture of the picture extracting means S2, and a pattern checking means 54 which executes the pattern check of the synthesized picture. Thus, only holes having an objective diameter are filled up in the synthesized picture.
申请公布号 JPH0567194(A) 申请公布日期 1993.03.19
申请号 JP19910254396 申请日期 1991.09.06
申请人 NIPPON STEEL CORP 发明人 MURE HIROSHI;IMURA YOSHIHIKO;ITO HIDEKI;IZEKI HIDEO
分类号 G01B11/24;G01B11/245;G01N21/88;G01N21/956;G06T1/00;H04N7/18;H05K3/00 主分类号 G01B11/24
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