发明名称 METHOD OF CLEANING SEMICONDUCTOR WAFERS AND COMPUTER STORAGE DISKS
摘要 <p>Described is a process for utilizing an electric AC signal of a frequency preferably between 0.1 kHz and 1 GHz to modify and otherwise enhance the properties of deionized water used for the purpose of cleaning semiconductor wafers and computer storage disks before, during and after processing. Such treatment of the cleaning water enhances its ability to remove process chemicals, remove particulates, and otherwise improve the speed and economy of the cleaning process thereby directly improving the final yield of the chip or disk making process.</p>
申请公布号 WO1993004790(A1) 申请公布日期 1993.03.18
申请号 US1992007361 申请日期 1992.08.28
申请人 发明人
分类号 主分类号
代理机构 代理人
主权项
地址