发明名称 Method for manufacturing a bipolar transistor having a reduced collector-base capacitance.
摘要 <p>A method for manufacturing a bipolar transistor which includes a step of preparing a semiconductor substrate of first conductivity type, a step of sequentially forming a thin first insulating film, an electrically conducting film containing a second conductivity type impurity, and a second insulating film on the semiconductor substrate, a step of forming an opening by anisotropically etching the second insulating film and the conductive film in selective manner, a step of exposing the semiconductor surface by etching the first insulating film, a step of depositing a base layer of the second conductivity type on the surface of the semiconcuctor substrate exposed in the opening by epitaxial deposition. <IMAGE></p>
申请公布号 EP0532355(A2) 申请公布日期 1993.03.17
申请号 EP19920308310 申请日期 1992.09.11
申请人 NEC CORPORATION 发明人 KANO, ISAO
分类号 H01L29/73;H01L21/20;H01L21/285;H01L21/331;H01L29/732 主分类号 H01L29/73
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