CIRCUIT ARRANGEMENT OF A SENSOR FOR THE DETERMINATION OF CHANGES IN TESTED CAPACITOR CAPACITANCE

摘要

The output (10) of the source (1) of impulses is connected to the input (11) of the shaping circuit (2) of the tested condenser (3) and, at the same time, to the input (12) of the shaping circuit (4) of the comparing condenser (5). The output (13) of the shaping circuit (2) of the tested condenser (3) is connected to the first input (7) of the evaluating circuit (6) and the output (14) of the shaping circuit (4) of the comparing condenser (5) is connected to the second input (8) of the evaluating circuit (6).<IMAGE>