发明名称 PRE-CHARGE AUTOMATIC INSPECTION DEVICE IN MEMORY DEVICE
摘要 <p>PURPOSE: To shorten the precharging time of the memory element and increase the processing speed of data by interrupting precharging when the precharging is completed. CONSTITUTION: While a data line is precharged, a precharging circuit 10 is precharged as well as the precharging state of the data line, and a sense circuit 20 senses the state wherein the precharging is performed by the precharging circuit 10. After the signal from the sense circuit 20 is temporarily stored in a storage circuit 30, it is applied to a sensor amplifier 2 and the output of a clock signal for precharging the input side of the amplifier 2 is controlled. Namely, when the sense circuit 20 senses the completion of the precharging by the precharging circuit 10, the precharging of the data line is stopped and data stored in a dummy cell 1' is outputted according to an address inputted through address lines A0-A7.</p>
申请公布号 JPH0562489(A) 申请公布日期 1993.03.12
申请号 JP19920003133 申请日期 1992.01.10
申请人 SAMSUNG ELECTRON CO LTD 发明人 KIMU YUNNUON
分类号 G11C11/41;G11C7/10;G11C17/18 主分类号 G11C11/41
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