发明名称 Semiconductor integrated circuit device produced by charged-particle etching
摘要 A semiconductor integrated circuit device formed on the basis of the design rules of 0.5 mu m or less contains a MOS transistor. The MOS transistor is formed at the main surface region of the semiconductor substrate. If the effective gate area of the MOS transistor is S2 and the area of a contact hole made in an interlayer insulating film on the gate electrode of the MOS transistor is S1, the relationship expressed as S1/S2</=1.8 is established. The contact hole is made by RIE techniques.
申请公布号 US5192988(A) 申请公布日期 1993.03.09
申请号 US19910728532 申请日期 1991.07.11
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 YOSHII, ICHIRO
分类号 H01L21/302;H01L21/3065;H01L21/336;H01L21/768;H01L27/088;H01L29/423;H01L29/78 主分类号 H01L21/302
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