发明名称 CIRCUIT AND METHOD FOR DETECTING AN AMPLITUDE AND OFFSET DEVIATION OF TWO SINUSOIDAL SIGNALS
摘要 To detect amplitude deviations and/or offset deviations in two sinusoidal signals (S1, S2), electrically staggered from each other by 90 DEG , both signals (S1, S2) are evaluated by way of threshold stages (K11, K12, K21, K22). The zero passages of the one signal (S1, S2) each indicate trigger time points (1up, 1down, 2up, 2down) for the amplitude of the other signal (S2, S1) in each instance. The output signals (X1, X2, A, &upbar& A, B, &upbar& B) of the threshold stages (K11, K12, K21, K22) are analyzed in the a regulating mechanism. Regulation can take place in accordance with the errors detected.
申请公布号 US5192917(A) 申请公布日期 1993.03.09
申请号 US19910801938 申请日期 1991.12.03
申请人 SIEMENS AKTIENGESELLSCHAFT 发明人 SCHWEIGERT, RALF;DONAT, ALBRECHT
分类号 G01D5/244;G05F1/44;H03G3/20 主分类号 G01D5/244
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